Nano Scientific AFM integrates smart software, well positioned optics, proper illumination, and a straight forward design.
Cameras illuminate the tip & sample, and make setup easy.
Pre-aligned optics remove all laser and detector alignment, which is typical with most AFMs.
Multiple white LEDs illuminate the sample for proper positioning and setup.
Tip scanning design allows virutually any size sample to be imaged.
Basic AFM Specifications:
Sample Size | Unlimited without sample stage
100 mm on sample stage |
Maximum Petri dish height (fluid level) | 9 mm (6 mm) |
Manual approach range | 30 mm |
Automatic approach range | 1.0 mm |
Maximum scan range | 100 μm (1) |
Maximum Z-range | 10 μm (1) |
Drive Z-resolution | 0.152 nm (2) |
Drive XY-resolution | 1.525 nm (2) |
XY-linearity mean error | typ. 0.1% (max. 0.3%) |
XY-flatness at maximum scan range | typ. 5 nm (max. 15 nm) |
Z-measurement noise level (RMS, Static Mode in air) | typ. 0.20 nm |
Z-measurement noise level (RMS, Dynamic Mode in air) | typ. 0.16 nm |
Scan head dimensions | 143 × 158 × 53 mm |
Scan head weight | 1.25 kg |