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Transmission Electron Microscope

 

TEM — has been used in all areas of biological and biomedical investigations because of its ability to view the finest cell structures. It is also used as a diagnostic tool in hospital pathology labs. For the crystallographer, metallurgist or semiconductor research scientist, current high voltage/high resolution TEMs, utilizing 200 keV to 1 MeV, have permitted the routine imaging of atoms, allowing materials researchers to monitor and design materials with custom-tailored properties. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter.

Nano Scientific has produced TEMs since 1965, and currently markets state-of-the-art instruments in the 100 keV to 1 MeV ranges designed to support all TEM applications.

 

 

TEM Comparission Chart:

 

ResolutionAccelerating
Voltage
Magnification
TEM-NS1600D0.14nm Lattice80 to 200 kVx50 to 1,500,000
TEM-NS1200S0.10nm Lattice80 to 200 kVx50 to 1,500,000
TEM-NS22000.14nm Lattice80 to 200 kVx50 to 1,500,000
TEM-NS2800CSTEM
0.2nm Lattice

0.14nm Lattice
80 to 200 kVx100 to 20,000,000

 

 

 

 

TEM-NS1100 Specifications

High ContrastSTEM
TEM ModeSTEM Mode
Resolution
Lattice Image
Point Image

0.20nm
0.38nm

0.20nm
0.38nm
-
-
Accel Voltage
Steps (5)
Variable Steps

40 - 120 kV
33 V min. step
Magnification
Mag Mode
Low Mag Mode
SA Mag Mode

x200-1,200,000
x50-1,000
x2,000-300,000

x200-1,200,000
x50-1,000
x2,000-300,000

x5,000-2,000,000
x120-4,000
-
Specimen Chamber

1 ±25° (±70° with optional holder